TECHNICAL SPECIFICATIONS
APPLICATIONS
FEATURES
ICP power source: 5.5 KW
Bias power source: 1.5 KW
Dual source
Process temperature: 0 to 40°
Clamping chuck: Electrostatic
Gas:SF6, C4F8, O2, Ar, N2, He
Mask: PR, SiO2
WAFERS
6 inch, samples can be glued on 4’’ carrier wafer
End point detection
CLARITAS OES system integrated